Nanometer-Scale Imaging of Lattice Deformation with Transmission Electron Micrograph
Ide, Takashi, Sakai, Akira, Shimizu, KeijiVolume:
37
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.37.L1546
Date:
December, 1998
File:
PDF, 433 KB
english, 1998