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Experimental and Simulated Results of Room Temperature Single Electron Transistor Formed by Atomic Force Microscopy Nano-Oxidation Process
Gotoh, Yoshitaka, Matsumoto, Kazuhiko, Bubanja, Vladimir, Vazquez, Francisco, Maeda, Tatsuro, Harris, James S.Volume:
39
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.39.2334
Date:
April, 2000
File:
PDF, 288 KB
english, 2000