Observation of Branched Complicated Defect and its...

Japanese Journal of Applied Physics 2001 / 5 Vol. 40; Iss. Part 1, No

Observation of Branched Complicated Defect and its Nondestructive Evaluation by Photoacoustic Microscopy

Endoh, Haruo, Yaegashi, Naoto, Hiwatashi, Yoichiro, Hoshimiya, Tsutomu
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Volume:
40
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.40.3604
Date:
May, 2001
File:
PDF, 364 KB
2001
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