Quantitative Effects of Preferred Orientation and Impurity Phases on Ferroelectric Properties of SrBi 2 (Ta 1- x Nb x ) 2 O 9 Thin Films Measured by X-Ray Diffraction Reciprocal Space Mapping
Saito, Keisuke, Yamaji, Isao, Akai, Takao, Mitsuya, Masatoshi, Funakubo, HiroshiVolume:
42
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.42.539
Date:
February, 2003
File:
PDF, 1.99 MB
english, 2003