Monitoring Conditions of Cantilever during Conducting Atomic Force Microscopy Spectroscopy Measurements
Oohira, Tsunehiro, Ando, AtsushiVolume:
45
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.45.1934
Date:
March, 2006
File:
PDF, 177 KB
english, 2006