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[ACM Press the conference - Munich, Germany (2008.03.10-2008.03.14)] Proceedings of the conference on Design, automation and test in Europe - DATE '08 - Test scheduling for wafer-level test-during-burn-in of core-based SoCs
Bahukudumbi, Sudarshan, Chakrabarty, Krishnendu, Kacprowicz, RichardYear:
2008
Language:
english
DOI:
10.1145/1403375.1403640
File:
PDF, 409 KB
english, 2008