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AIP Conference Proceedings [AIP OPTICS: PHENOMENA, MATERIALS, DEVICES, AND CHARACTERIZATION: OPTICS 2011: International Conference on Light - Kerala, (India) (23–25 May 2011)] - Application of Rietveld Method to the Structural Characteristics of some Bulk and Nanocrystalline Materials
Kumar, Sudhish, Dolia, S. N., Singhal, R. K., Predeep, P., Thakur, Mrinal, Varma, M. K. RaviYear:
2011
Language:
english
DOI:
10.1063/1.3646781
File:
PDF, 397 KB
english, 2011