Erratum: X-ray grazing incidence diffraction from...

Erratum: X-ray grazing incidence diffraction from alkylsiloxane monolayers on silicon wafers [J. Chem. Phys. 95, 2854 (1991)]

Tidswell, I. M., Rabedeau, T. A., Pershan, P. S., Kosowsky, S. D., Folkers, J. P., Whitesides, George M.
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Volume:
98
Year:
1993
Language:
english
Journal:
The Journal of Chemical Physics
DOI:
10.1063/1.465126
File:
PDF, 369 KB
english, 1993
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