A new spectrophotometer system for measuring thermal...

Measurement Science and Technology 2001 / 12 Vol. 12; Iss. 12

A new spectrophotometer system for measuring thermal radiation phenomena in a 0.30-11 µm wavelength region

Wakabayashi, Hidenobu, Makino, Toshiro
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Volume:
12
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/12/12/312
Date:
December, 2001
File:
PDF, 350 KB
english, 2001
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