Stress analysis in cubic boron nitride films by x-ray...

Acta Physica Sinica (Overseas Edition) 1998 / 01 Vol. 7; Iss. 1

Stress analysis in cubic boron nitride films by x-ray diffraction using sin 2 ψ method

Xing-wang, Zhang, Jin-shun, Yue, Guang-hua, Chen, Hui, Yan, Wen-jun, Liu
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Volume:
7
Language:
english
Journal:
Acta Physica Sinica (Overseas Edition)
DOI:
10.1088/1004-423X/7/1/007
Date:
January, 1998
File:
PDF, 485 KB
english, 1998
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