Automatic Test Stimulus Generation for Diagnosis of RF...

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IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2015

Automatic Test Stimulus Generation for Diagnosis of RF Transceivers Using Model Parameter Estimation

Banerjee, Aritra, Chatterjee, Abhijit
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Year:
2015
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2014.2385863
File:
PDF, 1.65 MB
english, 2015
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