SIMULATION AND EXPECTATION IN SENSOR-BASED SYSTEMS

International Journal of Pattern Recognition and Artificial Intelligence 1993 / 02 Vol. 7; Iss. 1

SIMULATION AND EXPECTATION IN SENSOR-BASED SYSTEMS

ROTH, YUVAL, JAIN, RAMESH
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Volume:
7
Language:
english
Journal:
International Journal of Pattern Recognition and Artificial Intelligence
DOI:
10.1142/S0218001493000091
Date:
February, 1993
File:
PDF, 1.43 MB
english, 1993
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