Micro-Probe Reflection High-Energy Electron Diffraction...

Japanese Journal of Applied Physics 1982 / 1 Vol. 21; Iss. Part 1, No

Micro-Probe Reflection High-Energy Electron Diffraction Technique. II. Observation of Aluminum Epitaxial Growth on a Polycrystal-Silicon Surface by Vacuum Evaporation

Ichikawa, Masakazu, Hayakawa, Kazunobu
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
21
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.21.154
Date:
January, 1982
File:
PDF, 211 KB
english, 1982
Conversion to is in progress
Conversion to is failed