Chemical Analysis of Surfaces by Total-Reflection-Angle X-Ray Spectroscopy in RHEED Experiments (RHEED-TRAXS)
Hasegawa, Shuji, Ino, Shozo, Yamamoto, Youiti, Daimon, HiroshiVolume:
24
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.24.L387
Date:
June, 1985
File:
PDF, 373 KB
english, 1985