Linewidth Measurement by a New Scanning Tunneling Microscope
Yamada, Hirofumi, Fujii, Toru, Nakayama, KanVolume:
28
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.28.2402
Date:
November, 1989
File:
PDF, 1.08 MB
english, 1989