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In Situ Infrared Study of Surface Oxide Formation on Gas-Evaporated Si Microcrystals
Hayashi, Shinji, Kawata, Satoshi, Kim, Han Min, Yamamoto, KeiichiVolume:
32
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.4870
Date:
November, 1993
File:
PDF, 409 KB
english, 1993