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A Newly Developed 300 kV Field-Emission Analytical Transmission Electron Microscope
Bando, Yoshio, Kitami, Yoshizo, Tomita, Takeshi, Honda, Toshikazu, Ishida, YukihisaVolume:
32
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.L1704
Date:
November, 1993
File:
PDF, 455 KB
english, 1993