Accurate Determination of the Urbach Energy of a-Si:H Thin Films by Correction for the Interference Effect
Leblanc, François, Maeda, Yoshihito, Ando, Masahiko, Wakagi, Masatoshi, Minemura, TetsurohVolume:
33
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.33.L1755
Date:
December, 1994
File:
PDF, 248 KB
english, 1994