![](/img/cover-not-exists.png)
Effects of the Aspect Ratio on Stress-Induced Open Failure in an Aluminum Line of LSI Interconnects
Hiraoka, KazunoriVolume:
33
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.33.L87
Date:
January, 1994
File:
PDF, 117 KB
english, 1994