Improved Stability of Metal-Insulator-Diamond Semiconductor...

Japanese Journal of Applied Physics 1998 / 12 Vol. 37; Iss. Part 2, No

Improved Stability of Metal-Insulator-Diamond Semiconductor Interface by Employing BaF2 Insulator Film

Tanaka, Hiroyuki, Yun, Young, Shirakawa, Yusuke, Maki, Tetsuro, Kobayashi, Takeshi
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Volume:
37
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.37.L1444
Date:
December, 1998
File:
PDF, 211 KB
english, 1998
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