Growth of CuPc Thin Films on Structured SiO...

Japanese Journal of Applied Physics 2003 / 6 Vol. 42; Iss. Part 1, No

Growth of CuPc Thin Films on Structured SiO 2 /Si(100) Studied by Metastable Electron Emission Microscopy and Photoelectron Emission Microscopy

Onoue, Miki, Ibe, Takahiro, Miyauchi, Jun, Shionoiri, Masakazu, Abdureym, Abduaini, Kera, Satoshi, Okudaira, Kouji. K., Harada, Yoshiya, Ueno, Nobuo
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Volume:
42
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.42.3588
Date:
June, 2003
File:
PDF, 787 KB
english, 2003
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