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Temperature Dependence of the Subthreshold Characteristics of Dynamic Threshold Metal–Oxide–Semiconductor Field-Effect Transistors and Its Application to an Absolute-Temperature Sensing Scheme for Low-Voltage Operation
Terauchi, MamoruVolume:
46
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.46.4102
Date:
July, 2007
File:
PDF, 1.16 MB
english, 2007