An Analysis of the Field Dependence of Interface Trap...

Japanese Journal of Applied Physics 2011 / 1 Vol. 50

An Analysis of the Field Dependence of Interface Trap Generation under Negative Bias Temperature Instability Stress using Wentzel–Kramers–Brillouin with Density Gradient Method

Choi, SeongWook, Baek, Chang-Ki, Park, Sooyoung, Park, Young June
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
50
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.50.014302
Date:
January, 2011
File:
PDF, 409 KB
2011
Conversion to is in progress
Conversion to is failed