The Observation of “Conduction Spot” on NiO Resistance Random Access Memory
Kondo, Hirofumi, Arita, Masashi, Fujii, Takashi, Kaji, Hiromichi, Moniwa, Masahiro, Yamaguchi, Takeshi, Fujiwara, Ichiro, Yoshimaru, Masaki, Takahashi, YasuoVolume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.50.081101
Date:
August, 2011
File:
PDF, 1.49 MB
english, 2011