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Ion-Beam-Induced Luminescence Analysis as Diagnostic Tool for Microstructure Patterning on Diamond by Proton Beam Writing
Kada, Wataru, Yokoyama, Akihito, Koka, Masashi, Takano, Katsuyoshi, Satoh, Takahiro, Kamiya, TomihiroVolume:
51
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.51.06FB07
Date:
June, 2012
File:
PDF, 629 KB
english, 2012