Rapid Reversible Degradation of Silicon Thin Films by a...

Japanese Journal of Applied Physics 2012 / 7 Vol. 51

Rapid Reversible Degradation of Silicon Thin Films by a Treatment in Water

Turan, Elif, Yilmaz, Gokhan, Smirnov, Vladimir, Finger, Friedhelm, Günes, Mehmet
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Volume:
51
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.51.070210
Date:
July, 2012
File:
PDF, 258 KB
english, 2012
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