[ACM Press the 2002 IEEE/ACM international conference - San Jose, California (2002.11.10-2002.11.14)] Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design - ICCAD '02 - Conflict driven techniques for improving deterministic test pattern generation
Wang, Chen, Reddy, Sudhakar M., Pomeranz, Irith, Lin, Xijiang, Rajski, JanuszYear:
2002
Language:
english
DOI:
10.1145/774572.774585
File:
PDF, 139 KB
english, 2002