Sensitivity of parallel applications to large differences in bandwidth and latency in two-layer interconnects
Aske Plaat, Henri E. Bal, Rutger F.H. Hofman, Thilo KielmannVolume:
17
Year:
2001
Language:
english
Pages:
14
DOI:
10.1016/s0167-739x(00)00103-5
File:
PDF, 370 KB
english, 2001