Correlated high-resolution x-ray diffraction,...

Applied Physics Letters 2015 / 07 Vol. 107; Iss. 2

Correlated high-resolution x-ray diffraction, photoluminescence, and atom probe tomography analysis of continuous and discontinuous InxGa1−xN quantum wells

Ren, Xiaochen, Riley, James R., Koleske, Daniel D., Lauhon, Lincoln J.
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Volume:
107
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4926808
Date:
July, 2015
File:
PDF, 1.69 MB
english, 2015
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