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Analysis of the phase signal in reflection anisotropy spectroscopy
Dietrich, W, Emde, M von der, Zahn, D R TVolume:
10
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/10/8/009
Date:
August, 1995
File:
PDF, 388 KB
english, 1995