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Interface roughness and period variations in the AlGaAs system grown by molecular beam epitaxy
Fewster, P F, Andrew, N L, Curling, C JVolume:
6
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/6/1/002
Date:
January, 1991
File:
PDF, 406 KB
english, 1991