Effect of lanthanum doping in ceria abrasives on chemical mechanical polishing selectivity for shallow trench isolation
Praveen, B.V.S., Cho, Byoung-Jun, Park, Jin-Goo, Ramanathan, S.Volume:
33
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2015.01.049
Date:
May, 2015
File:
PDF, 2.68 MB
english, 2015