Possibilities of X-ray interference diffractometry for the reconstruction of two-dimensional lattice deformation profiles in crystals
Aristov, V V, Goureev, T E, Nikulin, A Yu, Petrashen, P V, Snigirev, A AVolume:
7
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/7/8/014
Date:
August, 1992
File:
PDF, 241 KB
english, 1992