Possibilities of X-ray interference diffractometry for the...

Possibilities of X-ray interference diffractometry for the reconstruction of two-dimensional lattice deformation profiles in crystals

Aristov, V V, Goureev, T E, Nikulin, A Yu, Petrashen, P V, Snigirev, A A
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Volume:
7
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/7/8/014
Date:
August, 1992
File:
PDF, 241 KB
english, 1992
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