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Techniques for microwave measurements of ferroelectric thin films and their associated error and limitations
Petrov, P K, Alford, N McN, Gevorgyan, SVolume:
16
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/16/2/035
Date:
February, 2005
File:
PDF, 645 KB
english, 2005