Temperature-dependent low electric field charging of Si...

Nanotechnology 2009 / 07 Vol. 20; Iss. 30

Temperature-dependent low electric field charging of Si nanocrystals embedded within oxide–nitride–oxide dielectric stacks

Nikolaou, N, Dimitrakis, P, Normand, P, Schamm, S, Bonafos, C, Ben Assayag, G, Mouti, A, Ioannou-Sougleridis, V
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Volume:
20
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/20/30/305704
Date:
July, 2009
File:
PDF, 1.11 MB
english, 2009
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