Comparison of Cu-MgO Interfaces Studied by EXES and XPS

Surface Review and Letters 1998 / 02 Vol. 5; Iss. 1

Comparison of Cu-MgO Interfaces Studied by EXES and XPS

Jonnard, P., Hombourger, C., Vergand, F., Bonnelle, C., Ealet, B., Renou, A., Gillet, E.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
5
Language:
english
Journal:
Surface Review and Letters
DOI:
10.1142/S0218625X98000682
Date:
February, 1998
File:
PDF, 307 KB
english, 1998
Conversion to is in progress
Conversion to is failed