Topographic Representation of Emission Intensity by the...

Japanese Journal of Applied Physics 1976 / 10 Vol. 15; Iss. 10

Topographic Representation of Emission Intensity by the Scanning-Type Field Emission Microscope

Okano, Tatsuo, Utagawa, Kenji, Tominaga, Goroh
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Volume:
15
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.15.2035
Date:
October, 1976
File:
PDF, 394 KB
1976
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