X-Ray Topographic Study of Defects in ADP Single Crystal

Japanese Journal of Applied Physics 1978 / 1 Vol. 17; Iss. 1

X-Ray Topographic Study of Defects in ADP Single Crystal

Ōki, Shigeru, Futagami, Kōji, Agashi, Yoshito
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Volume:
17
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.17.23
Date:
January, 1978
File:
PDF, 327 KB
english, 1978
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