Incorporation of Oxygen into Silicon during Pulsed-Laser Irradiation
Hoh, Koichiro, Koyama, Hiroshi, Uda, Keiichiro, Miura, YoshioVolume:
19
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.19.L375
Date:
July, 1980
File:
PDF, 727 KB
1980