Nondestructive Measurement of Minority Carrier Lifetimes in...

Japanese Journal of Applied Physics 1986 / 5 Vol. 25; Iss. Part 1, No

Nondestructive Measurement of Minority Carrier Lifetimes in Si Wafers Using Frequency Dependence of ac Photovoltages

Honma, Noriaki, Munakata, Chusuke, Itoh, Haruo, Warabisako, Terunori
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Volume:
25
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.25.743
Date:
May, 1986
File:
PDF, 159 KB
english, 1986
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