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Analysis of the Correlative Characteristics between Adjacent Pixels of Amplified Metal Oxide Semiconductor Imager by a New-Type Least Squares Method
Taketoshi, Kazuhisa, Andoh, Fumihiko, Tanaka, Katsu, Imai, MasaharuVolume:
32
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.2709
Date:
June, 1993
File:
PDF, 384 KB
english, 1993