Microscopic Mechanism of Electrical Noise in Co/Si Thin Film Structures
Cho, Nam-Ihn, Nam, Hyoung Gin, Yu, Soon JaeVolume:
35
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.35.L695
Date:
June, 1996
File:
PDF, 2.17 MB
english, 1996