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Analysis of Drain Field and Hot Carrier Stability of Poly-Si Thin Film Transistors
Ayres, J. Richard, Brotherton, Stan D., McCulloch, David J., Trainor, Michael J.Volume:
37
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.37.1801
Date:
April, 1998
File:
PDF, 209 KB
english, 1998