Selective Plasma Etching for High-Aspect-Ratio Oxide Contact Holes
Kim, Yun-Sang, Wei, Peter Ta-Chin, Tynan, George R., Charatan, Robert, Hemker, DaveVolume:
37
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.37.327
Date:
January, 1998
File:
PDF, 1020 KB
1998