Simulation of Thermal-Neutron-Induced Single-Event Upset...

Japanese Journal of Applied Physics 2007 / 6 Vol. 46; Iss. 6A

Simulation of Thermal-Neutron-Induced Single-Event Upset Using Particle and Heavy-Ion Transport Code System

Arita, Yutaka, Niita, Koji, Kihara, Yuji, Mitsuhasi, Junich, Takai, Mikio, Ogawa, Izumi, Kishimoto, Tadafumi, Yoshihara, Tsutomu
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Volume:
46
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.46.3377
Date:
June, 2007
File:
PDF, 702 KB
2007
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