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Effect of Interface Layers on Phase-Change Recording Material Analyzed by Hard X-ray Photoelectron Spectroscopy Method
Nakai, Tsukasa, Yoshiki, Masahiko, Ohmachi, NoritakeVolume:
46
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.46.3968
Date:
June, 2007
File:
PDF, 544 KB
english, 2007