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Novel Circuitry Configuration with Paired-Cell Erase Operation for High-Density 90-nm Embedded Resistive Random Access Memory
Sato, Yoshihiro, Tsunoda, Koji, Aoki, Masaki, Sugiyama, YoshihiroVolume:
48
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.48.04C075
Date:
April, 2009
File:
PDF, 678 KB
english, 2009