![](/img/cover-not-exists.png)
A new technique for IDDQ testing in nanometer technologies
Y. Tsiatouhas, Y. Moisiadis, Th. Haniotakis, D. Nikolos, A. ArapoyanniVolume:
31
Year:
2002
Language:
english
Pages:
12
DOI:
10.1016/s0167-9260(02)00023-8
File:
PDF, 194 KB
english, 2002