Analysis of Within-Die Complementary...

Japanese Journal of Applied Physics 2011 / 4 Vol. 50; Iss. 4

Analysis of Within-Die Complementary Metal–Oxide–Semiconductor Process Variation with Reconfigurable Ring Oscillator Arrays Using HiSIM

Ansari, Tania, Imafuku, Wataru, Kawabata, Akio, Yasuda, Masahiro, Koide, Tetsushi, Mattausch, Hans Jürgen
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Volume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.50.04DE05
Date:
April, 2011
File:
PDF, 432 KB
english, 2011
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