Oxide Structure Dependence of SiO$_{2}$/SiO$_{x}$/3C-SiC/n-Type Si Nonvolatile Resistive Memory on Memory Operation Characteristics
Yamaguchi, Yuichiro, Shouji, Masatsugu, Suda, YoshiyukiVolume:
51
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.51.114201
Date:
October, 2012
File:
PDF, 147 KB
english, 2012